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Reference details
| Author(s)
| Year
| Title
| Reference
| View/Download
|
Les Hatton | 1997b | Re-examining the fault density - component size connection | IEEE Software, 14(2), p.89-97 | Ubend_IS697.pdf |
Synopsis and invited feedback
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| Synopsis
| Invited Feedback
| Importance (/10, author rated :-) )
|
| Observes from a number of experiments that the fault curve rises logarithmically with function size until it reaches a point at around 300 lines of code at which point it becomes quadratic. The implication is that both small and large components are unusually error prone. The paper then develops a mathematical model of reliability based on the properties of the human short term and long term memory which explains this. | None yet | 9 |
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Auto-generated: $Revision: 1.43 $, $Date: 2008/03/03 23:38:56 $, Copyright Les Hatton 2001-
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